Class G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
Subclass 10/00: Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 12251272 | Systems and methods for optogenetic imaging using semi-kinematic coupling | Jun 17, 22 | Mar 18, 25 | Inscopix, Inc. |
| 12253538 | Method of examining a sample in a scanning tunneling microscope using tip-to-sample distance variations | Jul 13, 21 | Mar 18, 25 | CESKE VYSOKE UCENI TECHNICKE V PRAZE, FAKULTA STROJNI |
| 12109074 | Systems and methods for optogenetic imaging | May 17, 23 | Oct 08, 24 | Inscopix, Inc. |
| 11733265 | Method of imaging a surface using a scanning probe microscope | Oct 23, 20 | Aug 22, 23 | INFINITESIMA LIMITED |
| 11690696 | Systems and methods for optogenetic imaging | Sep 24, 21 | Jul 04, 23 | INSCOPIX, INC. |
| 11519130 | Method and apparatus for detecting an energized e-field | Oct 22, 20 | Dec 06, 22 | Whirlpool Corporation |
| 11493634 | Programmable light curtains | Mar 11, 19 | Nov 08, 22 | Carnegie Mellon University |
| 11265373 | Systems and methods to discover and notify devices that come in close proximity with each other | Aug 02, 21 | Mar 01, 22 | Not available |
| 11197735 | Systems and methods for optogenetic imaging | Apr 17, 20 | Dec 14, 21 | INSCOPIX, INC. |
| 11115467 | Systems and methods to discover and notify devices that come in close proximity with each other | Apr 09, 21 | Sep 07, 21 | Not available |
| 10983142 | Depassivation lithography by scanning tunneling microscopy | Oct 22, 19 | Apr 20, 21 | Zyvex Labs LLC |
| 10928418 | Scanning probe microscope | Jun 28, 18 | Feb 23, 21 | INFINITESIMA LIMITED |
| 10866262 | Multi-axis positioning device | Jun 07, 18 | Dec 15, 20 | GETEC MICROSCOPY GMBH |
| 10816586 | Method and apparatus for detecting an energized e-field | Jun 14, 18 | Oct 27, 20 | Whirlpool Corporation |
| 10712364 | Metrology devices for rapid specimen setup | Nov 03, 16 | Jul 14, 20 | Board of Regents The University of Texas Systems |
| 10684307 | Imaging a gap between sample and probe of a scanning probe microscope in a substantially horizontal side view | Nov 20, 17 | Jun 16, 20 | Anton Paar GmbH |
| 10682197 | Systems and methods for optogenetic imaging | Apr 27, 18 | Jun 16, 20 | INSCOPIX, INC. |
| 10564181 | Atomic force microscope with optical guiding mechanism | Aug 27, 18 | Feb 18, 20 | Nanosurf AG |
| 10557865 | Quantitative measurements using multiple frequency atomic force microscopy | Jul 03, 17 | Feb 11, 20 | Oxford Instruments Asylum Research, Inc. |
| 10431419 | Sparse sampling methods and probe systems for analytical instruments | Jul 07, 17 | Oct 01, 19 | Battelle Memorial Institute |
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2025/0017,683 | SYSTEMS AND METHODS FOR OPTOGENETIC IMAGING | Oct 01, 24 | Jan 16, 25 | Inscopix, Inc. |
| 2024/0207,011 | MULTI-MODAL MICROSCOPIC IMAGING | Mar 05, 24 | Jun 27, 24 | Inscopix, Inc. |
| 2018/0292,439 | METHOD AND APPARATUS FOR DETECTING AN ENERGIZED E-FIELD | Jun 14, 18 | Oct 11, 18 | Not available |
| 2016/0266,165 | DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES | May 20, 16 | Sep 15, 16 | RAVE LLC |
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