G01R 1/24

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Class  G01R : MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES


Subclass 1/24: Details of instruments or arrangements of the types included in groups G01R 5/00-G01R 13/00 and G01R 31/00 (constructional details particular to arrangements for measuring the electric consumption G01R 11/02) Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
12174238 Intelligent wafer-level testing of photonic devicesSep 01, 21Dec 24, 24MELLANOX TECHNOLOGIES LTD.
12046787 Waveguide connector for connecting first and second waveguides, where the connector includes a male part, a female part and a self-alignment feature and a test system formed therefromMay 14, 21Jul 23, 24Teradyne Inc.
11927605 Interconnect system with high current and low leakage capabilityMay 28, 20Mar 12, 24KEITHLEY INSTRUMENTS, LLC
11848148 Voltage booster isolation transformer system and method of operating the sameMar 01, 21Dec 19, 23Hubbell Incorporated
11506686 High density waveguide assembly for millimeter and 5G applicationsJul 01, 20Nov 22, 22Advantest Corporation
11486900 Probe apparatusMay 22, 18Nov 01, 22Teknologian tutkimuskeskus VTT Oy
11112442 Quantum power sensor and method of measuring power in transmission linesSep 15, 17Sep 07, 21NPL MANAGEMENT LIMITED
10914756 Miniature test probeAug 14, 18Feb 09, 21Keysight Technologies, Inc.
10897840 Shield box, shield box assembly and apparatus for testing a semiconductor deviceJun 09, 17Jan 19, 21Advanced Semiconductor Engineering Korea, Inc.
10871508 Nonlinear transmission line (NLTL)-based miniature reflectometers with reduced heat dissipation and scalable tether lengthJun 30, 18Dec 22, 20Anritsu Company
10852252 Device and method for measuring absorbent hygiene productsAug 01, 17Dec 01, 20TEWS ELEKTRONIK GMBH & CO. KG
10775415 Test cable used in USB 3.0 type C and test method using the sameJun 20, 18Sep 15, 20PEGATRON CORPORATION
10680727 Over the air wireless test system for testing microelectronic devices integrated with antennaAug 07, 18Jun 09, 20MediaTek Inc.
10634700 Dual stripline test fixture apparatuses and methodsApr 18, 18Apr 28, 20The Boeing Company
10615892 Methods and devices for real-time monitoring of tunable filtersOct 29, 18Apr 07, 20Purdue Research Foundation
10541460 Apparatus and method for guided wave communications using an absorberJun 18, 19Jan 21, 20AT&T Intellectual Property I, L.P.
10469296 Frequency-scalable NLTL-based mm-wave vector signal de-modulatorAug 08, 18Nov 05, 19Anritsu Company
10403949 Re-filters for PIM measurements and a test bench utilizing the sameAug 02, 18Sep 03, 19SPINNER GMBH
10401389 Orthogonal field probesFeb 02, 17Sep 03, 19VDW DESIGN, LLC
10393772 Wave interface assembly for automatic test equipment for semiconductor testingFeb 04, 16Aug 27, 19Advantest Corporation

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2024/0118,327 DIAMOND SENSOR UNITJan 26, 22Apr 11, 24Sumitomo Electric Industries Ltd.
2020/0057,094 MINIATURE TEST PROBEAug 14, 18Feb 20, 20Not available
2019/0324,059 DUAL STRIPLINE TEST FIXTURE APPARATUSES AND METHODSApr 18, 18Oct 24, 19The Boeing Company
2019/0025,343 TEST CABLE AND TEST METHOD USING THE SAMEJun 20, 18Jan 24, 19PEGATRON CORPORATION

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Patents Issued To Date - By Filing Year

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