G01R

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Description

MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (measuring physical variables of any kind by conversion into electric variables, see Note (4) following the title of class G01; measuring diffusion of ions in an electric field, e.g. electrophoresis, electro-osmosis, G01N; investigating non-electric or non-magnetic properties of materials by using electric or magnetic methods G01N; indicating correct tuning of resonant circuits H03J 3/12; monitoring electronic pulse counters H03K 21/40; monitoring operation of communication systems H04)

Subclasses

Not Available
Subclass Title
1/00 Details of instruments or arrangements of the types included in groups G01R 5/00-G01R 13/00 and G01R 31/00 (constructional details particular to arrangements for measuring the electric consumption G01R 11/02)
1/02 Details of instruments or arrangements of the types included in groups G01R 5/00-G01R 13/00 and G01R 31/00 (constructional details particular to arrangements for measuring the electric consumption G01R 11/02) General constructional details (details of a kind applicable to measuring arrangements not specially adapted for a specific variable G01D 7/00)
1/04 Details of instruments or arrangements of the types included in groups G01R 5/00-G01R 13/00 and G01R 31/00 (constructional details particular to arrangements for measuring the electric consumption G01R 11/02) General constructional details (details of a kind applicable to measuring arrangements not specially adapted for a specific variable G01D 7/00) Housings; Supporting members; Arrangements of terminals
1/06 Details of instruments or arrangements of the types included in groups G01R 5/00-G01R 13/00 and G01R 31/00 (constructional details particular to arrangements for measuring the electric consumption G01R 11/02) General constructional details (details of a kind applicable to measuring arrangements not specially adapted for a specific variable G01D 7/00) Measuring leads; Measuring probes (G01R 19/145, G01R 19/165 take precedence; end pieces for leads H01R 11/00)
1/067 Details of instruments or arrangements of the types included in groups G01R 5/00-G01R 13/00 and G01R 31/00 (constructional details particular to arrangements for measuring the electric consumption G01R 11/02) General constructional details (details of a kind applicable to measuring arrangements not specially adapted for a specific variable G01D 7/00) Measuring leads; Measuring probes (G01R 19/145, G01R 19/165 take precedence; end pieces for leads H01R 11/00) Measuring probes

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Recent Patents

Not Available
Patent #TitleFiling DateIssue DatePatent Owner
9,119,923 Method and system for motor failure detection Apr 11, 08 Sep 01, 15 RESMED LIMITED, RESMED LIMITED
9,119,968 Band stop filter employing a capacitor and an inductor tank circuit to enhance MRI compatibility of active medical devices Jul 09, 12 Sep 01, 15 GREATBATCH LTD., GREATBATCH LTD.
9,120,578 Guidance apparatus of a tanker aircraft Mar 06, 13 Sep 01, 15 EADS CONSTRUCCIONES AERONAUTICAS S.A., EADS CONSTRUCCIONES AERONAUTICAS S.A.
9,121,550 Apparatus of a magnetic resonance multiphase flow meter Jul 12, 11 Sep 01, 15 BAKER HUGHES INCORPORATED, BAKER HUGHES INCORPORATED
9,121,687 Pinch detection device at opening/closing section, vehicle having the device, and method for detecting pinch at the opening/closing section Dec 16, 11 Sep 01, 15 RIB LABORATORY, INC., RIB LABORATORY, INC.; HONDA MOTOR CO. LTD.;
9,121,728 Linear position sensor Sep 29, 10 Sep 01, 15 CONTINENTAL AUTOMOTIVE GMBH, CONTINENTAL AUTOMOTIVE FRANCE; CONTINENTAL AUTOMOTIVE GMBH;
9,121,802 Method for characterizing integrated circuits for identification or security purposes Mar 30, 12 Sep 01, 15 THE BOEING COMPANY, THE BOEING COMPANY
9,121,814 Method and apparatus for determining a fraction of an adsorbed material contained in an adsorber material Feb 28, 11 Sep 01, 15 ENDRESS + HAUSER GMBH + CO. KG, ENDRESS & HAUSER GMBH & CO. KG
9,121,867 Sensor and transporting device including the same May 28, 13 Sep 01, 15 HON HAI PRECISION INDUSTRY CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD
9,121,868 Probes with offset arm and suspension structure Jun 19, 12 Sep 01, 15 MICROPROBE, INC., FORMFACTOR, INC.
9,121,869 Probe assembly, probe card including the same, and methods for manufacturing these Dec 18, 12 Sep 01, 15 KABUSHIKI KAISHA NIHON MICRONICS, KABUSHIKI KAISHA NIHON MICRONICS
9,121,870 Clamp meter with detachable clamp and clamp storage area Oct 18, 11 Sep 01, 15 MILWAUKEE ELECTRIC TOOL CORPORATION, MILWAUKEE ELECTRIC TOOL CORPORATION
9,121,871 Apparatus and method for voltage sensing Feb 28, 11 Sep 01, 15 UNIVERSITY OF NEWCASTLE UPON TYNE, UNIVERSITY OF NEWCASTLE UPON TYNE
9,121,872 Electro-optic effect based optical voltage transformer Oct 31, 11 Sep 01, 15 BEIJING AEROSPACE TIMES OPTICAL-ELECTRONIC TECHNOLOGY CO., LTD., BEIJING AEROSPACE TIMES OPTICAL-ELECTRONIC TECHNOLOGY CO., LTD.
9,121,873 Electronic circuit component authenticity determination method Jan 22, 13 Sep 01, 15 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
9,121,874 Method and apparatus for measuring radiated power of antenna Jan 10, 13 Sep 01, 15 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE, ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
9,121,875 Potential measuring device Apr 22, 13 Sep 01, 15 KOGANEI CORPORATION, KOGANEI CORPORATION
9,121,876 Generated power output measuring apparatus Mar 29, 13 Sep 01, 15 TOGAMI ELECTRIC MFG. CO., LTD., TOGAMI ELECTRIC MFG. CO. LTD.
9,121,877 System and method for wireless remote display for high voltage line meter Sep 19, 11 Sep 01, 15 HONEYWELL INTERNATIONAL INC., HONEYWELL INTERNATIONAL INC.
9,121,878 Method for contactless determination of electrical potential using oscillating electrode, and device Apr 14, 11 Sep 01, 15 SIEMENS AKTIENGESELLSCHAFT, SIEMENS AKTIENGESELLSCHAFT

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Recent Publications

Not Available
Publication #TitleFiling DatePub DatePatent Owner
2015/0247,763 OVERHEATING INDICATOR SYSTEM FOR POWER SUPPLY Dec 29, 14 Sep 03, 15 HON HAI PRECISION INDUSTRY CO., LTD.,
2015/0247,814 Method and apparatus for the analysis of wine Mar 02, 15 Sep 03, 15 BRUKER BIOSPIN GMBH,
2015/0247,882 SPRING PROBE Jan 26, 15 Sep 03, 15 MPI CORPORATION,
2015/0247,883 Digital oscilloscope and a method with parallel acquisition and signal post-processing Feb 27, 15 Sep 03, 15 ROHDE & SCHWARZ GMBH & CO. KG,
2015/0247,884 NON-CONTACT CURRENT SENSOR May 13, 15 Sep 03, 15 III HOLDINGS 3, LLC,
2015/0247,885 System comprising a probe and a measuring device Feb 27, 15 Sep 03, 15 ROHDE & SCHWARZ GMBH & CO. KG,
2015/0247,886 Transformer Phase Permutation Causing More Uniform Transformer Phase Aging and general switching network suitable for same Feb 28, 14 Sep 03, 15 INTERNATIONAL BUSINESS MACHINES CORPORATION,
2015/0247,887 SENSING DEVICE AND SENSING METHOD Apr 28, 15 Sep 03, 15 TERUMO KABUSHIKI KAISHA,
2015/0247,888 SPARK TESTING APPARATUS Jul 19, 12 Sep 03, 15 CMTE DEVELOPMENT LIMITED,
2015/0247,889 Supply Self Adjustment for Systems and Methods Having a Current Interface Feb 28, 14 Sep 03, 15 INFINEON TECHNOLOGIES AG,
2015/0247,890 CALCULATING CIRCUIT-LEVEL LEAKAGE USING THREE DIMENSIONAL TECHNOLOGY COMPUTER AIDED DESIGN AND A REDUCED NUMBER OF TRANSISTORS Feb 28, 14 Sep 03, 15 INTERNATIONAL BUSINESS MACHINES CORPORATION,
2015/0247,891 Detection of High Impedance Faults Sep 12, 12 Sep 03, 15 SIEMENS AKTIENGESELLSCHAFT,
2015/0247,892 METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS Feb 28, 14 Sep 03, 15 INTERNATIONAL BUSINESS MACHINES CORPORATION,
2015/0247,893 DEVICES AND METHOD FOR TESTING POWER-ON RESET VOLTAGE Feb 28, 14 Sep 03, 15 FREESCALE SEMICONDUCTOR, INC.,
2015/0247,894 TEMPERATURE CONTROL SYSTEM Oct 28, 14 Sep 03, 15 HON HAI PRECISION INDUSTRY CO., LTD.,
2015/0247,895 Test Handler and Circulation Method of Test Trays in Test Handler Mar 02, 15 Sep 03, 15 TECHWING CO., LTD.,
2015/0247,896 CIRCUIT FOR DETECTING STRUCTURAL DEFECTS IN AN INTEGRATED CIRCUIT CHIP, METHODS OF USE AND MANUFACTURE AND DESIGN STRUCTURES May 15, 15 Sep 03, 15 INTERNATIONAL BUSINESS MACHINES CORPORATION,
2015/0247,897 ADDRESSABLE TEST ACCESS PORT METHOD AND APPARATUS Apr 28, 15 Sep 03, 15 PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.,
2015/0247,898 FAULT DETECTION SYSTEM, GENERATION CIRCUIT, AND PROGRAM May 14, 13 Sep 03, 15 JAPAN SCIENCE AND TECHNOLOGY AGENCY,
2015/0247,899 SCAN TEST SYSTEM Sep 27, 12 Sep 03, 15 FREESCALE SEMICONDUCTOR, INC.,

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Patents Issued To Date - By Filing Year

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