Class G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
Subclass 30/02: Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 12228503 | Photothermal imaging device and system | Jan 03, 23 | Feb 18, 25 | University of Notre Dame Du Lac |
| 12222365 | Optical output system, measurement system, optical pump-probe scanning tunneling microscope system, computing device, program, and computing method | Nov 29, 19 | Feb 11, 25 | GTHERANOSTICS CO., LTD. |
| 12224154 | Conductive fixation for electron microscopy | Jan 10, 19 | Feb 11, 25 | University of Kansas |
| 12169209 | Nanoscale scanning sensors | Oct 12, 23 | Dec 17, 24 | President and Fellows of Harvard College |
| 12163979 | Nano robotic system for high throughput single cell DNA sequencing | Oct 27, 22 | Dec 10, 24 | Versitech Limited; City University of Hong Kong; |
| 12142454 | Detection of probabilistic process windows | Sep 10, 21 | Nov 12, 24 | Fractilla, LLC |
| 12055560 | Automated optimization of AFM light source positioning | Mar 21, 23 | Aug 06, 24 | Oxford Instruments Asylum Research, Inc. |
| 12007408 | Method for electrically examining electronic components of an integrated circuit | Nov 08, 19 | Jun 11, 24 | Forschungszentrum Juelich GmbH |
| 11996265 | System and method for generating and analyzing roughness measurements and their use for process monitoring and control | Jan 25, 22 | May 28, 24 | Fractilla, LLC |
| 11828772 | Sample, method for manufacturing sample, and method for measuring infrared absorption spectrum | Aug 05, 22 | Nov 28, 23 | Kioxia Corporation |
| 11815528 | Nanoscale scanning sensors | Feb 18, 22 | Nov 14, 23 | President and Fellows of Harvard College |
| 11761981 | Method and apparatus for identifying sample position in atomic force microscope | Dec 24, 21 | Sep 19, 23 | Park Systems Corp. |
| 11762046 | Method and apparatus for measuring magnetic field strength | Aug 24, 20 | Sep 19, 23 | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 11714103 | Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy | Feb 09, 21 | Aug 01, 23 | Bruker Nano, Inc. |
| 11680963 | Method and apparatus for examining a measuring tip of a scanning probe microscope | Dec 15, 21 | Jun 20, 23 | Carl Zeiss SMT GmbH |
| 11674976 | Scanning probe microscope with a sample holder fed with electromagnetic wave signals | Dec 13, 19 | Jun 13, 23 | ALCATERA INC. |
| 11670480 | System and method for generating and analyzing roughness measurements | May 10, 21 | Jun 06, 23 | Fractilia, LLC |
| 11619649 | Atomic force microscope equipped with optical measurement device and method of acquiring information on surface of measurement target using the same | Nov 26, 21 | Apr 04, 23 | Park Systems Corp. |
| 11609164 | Thermal desorbers | Mar 18, 22 | Mar 21, 23 | HAMILTON SUNDSTRAND CORPORATION |
| 11592391 | Photothermal imaging device and system | May 18, 20 | Feb 28, 23 | University of Notre Dame Du Lac |
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2025/0069,843 | Detection of Probabilistic Process Windows | Nov 11, 24 | Feb 27, 25 | Fractilia, LLC |
| 2024/0361,351 | METHODS FOR FEEDBACK DETECTION OF A MEMS ARRAY | Apr 26, 24 | Oct 31, 24 | Not available |
| 2024/0312,757 | SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS AND THEIR USE FOR PROCESS MONITORING AND CONTROL | May 24, 24 | Sep 19, 24 | Fractilia, LLC |
| 2024/0288,468 | METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING PROBE MICROSCOPY DEVICE, AND A COMPUTER PROGRAM PRODUCT FOR PERFORMING SAID METHOD | Jun 21, 22 | Aug 29, 24 | Not available |
| 2024/0280,605 | MEASUREMENT SYSTEM AND PROBE TIP LANDING METHOD | Feb 17, 23 | Aug 22, 24 | WINBOND ELECTRONICS CORP. |
| 2024/0280,606 | DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING METHOD | Feb 03, 22 | Aug 22, 24 | Not available |
| 2024/0258,066 | Method of Dispositioning and Control of a Semiconductor Manufacturing Process | Jan 17, 24 | Aug 01, 24 | Fractilia, LLC |
| 2024/0210,442 | METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTICAL MICROSCOPE, CALIBRATION STRUCTURE AND SCANNING PROBE MICROSCOPY DEVICE | Apr 28, 22 | Jun 27, 24 | Not available |
| 2024/0168,053 | Nano-Mechanical Infrared Spectroscopy System and Method Using Gated Peak Force IR | Nov 20, 23 | May 23, 24 | Not available |
| 2024/0126,061 | SCANNING PROBE MICROSCOPE | Oct 16, 23 | Apr 18, 24 | Not available |
| 2023/0003,762 | DEVICE AND METHOD FOR COMPREHENSIVE CHARACTERIZATION, ANALYSIS, HETERO-GENITY AND PURITY QUANTIFICATION OF EXTRACELLULAR VESICLES | Aug 15, 22 | Jan 05, 23 | Lua Optomekatronik ARGE A.S. |
| 2021/0389,345 | FREQUENCY TRACKING FOR SUBSURFACE ATOMIC FORCE MICROSCOPY | Oct 24, 19 | Dec 16, 21 | Not available |
| 2021/0066,027 | SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS AND THEIR USE FOR PROCESS MONITORING AND CONTROL | Nov 13, 20 | Mar 04, 21 | Fractilia, LLC |
| 2021/0018,409 | THERMAL DESORBERS | Jul 16, 19 | Jan 21, 21 | Not available |
| 2020/0141,971 | MULTI-AXIS POSITIONING DEVICE | Jun 07, 18 | May 07, 20 | Not available |
| 2019/0391,177 | Method and Apparatus for Resolution and Sensitivity Enhanced Atomic Force Microscope Based Infrared Spectroscopy | Mar 12, 19 | Dec 26, 19 | Not available |
| 2019/0293,681 | SCANNING PROBE MICROSCOPE AND SCANNING METHOD USING THE SAME | Mar 22, 19 | Sep 26, 19 | Not available |
| 2019/0212,361 | SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE | Jan 07, 19 | Jul 11, 19 | Not available |
| 2019/0170,787 | METHOD AND APPARATUS FOR POSITIONING A MICRO- OR NANO-OBJECT UNDER VISUAL OBSERVATION | Mar 23, 17 | Jun 06, 19 | Not available |
| 2019/0011,478 | OBSERVATION METHOD USING COMPOUND MICROSCOPE INCLUDING AN INVERTED OPTICAL MICROSCOPE AND ATOMIC FORCE MICROSCOPE, PROGRAM TO PERFORM OBSERVATION METHOD, AND COMPOUND MICROSCOPE | Aug 24, 18 | Jan 10, 19 | OLYMPUS CORPORATION |
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