Description
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
G01Q
Technology
Sub-Class
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- 14 367 US PATENTS IN FORCE
- 125 US APPLICATIONS PENDING
- 294 Total Patent Owners
- 1335 TOTAL INVENTORS
Subclasses
| Subclass | Title |
|---|---|
| 10/00 | Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe |
| 10/02 | Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe Coarse scanning or positioning |
| 10/04 | Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe Fine scanning or positioning |
| 10/06 | Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe Fine scanning or positioning Circuits or algorithms therefor |
| 20/00 | Monitoring the movement or position of the probe |
Recent Patents
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 9,115,981 | Apparatus and method for investigating an object | Sep 26, 13 | Aug 25, 15 | CARL ZEISS SMS GMBH |
| 9,116,167 | Method and apparatus of tuning a scanning probe microscope | Mar 31, 15 | Aug 25, 15 | BRUKER NANO, INC. |
| 9,116,168 | Low drift scanning probe microscope | Oct 21, 14 | Aug 25, 15 | BRUKER NANO, INC. |
| 9,110,092 | Scanning probe based apparatus and methods for low-force profiling of sample surfaces and detection and mapping of local mechanical and electromagnetic properties in non-resonant oscillatory mode | Apr 07, 14 | Aug 18, 15 | |
| 9,110,093 | Sealed AFM cell | Nov 15, 12 | Aug 18, 15 | NATIONAL UNIVERSITY CORPORATION KANAZAWA UNIVERSITY |
| 9,110,094 | Measurement of surface energy components and wettability of reservoir rock utilizing atomic force microscopy | Jan 17, 14 | Aug 18, 15 | SCHLUMBERGER TECHNOLOGY CORPORATION, |
| 9,102,190 | Method of fabricating nanotips with controlled profile | Sep 26, 12 | Aug 11, 15 | THE GOVERNORS OF THE UNIVERSITY OF ALBERTA, |
Recent Publications
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2015/0247,809 | Scanning Frequency Comb Microscopy (SFCM) For Carrier Profiling in Semiconductors | Mar 02, 15 | Sep 03, 15 | Not available |
| 2015/0247,881 | Method and Apparatus to Compensate for Deflection Artifacts in an Atomic Force Microscope | Feb 28, 14 | Sep 03, 15 | BRUKER NANO, INC. |
| 2015/0241,334 | Peak Force Photothermal-Based Detection of IR Nanoabsorption | Feb 10, 15 | Aug 27, 15 | BRUKER NANO, INC. |
| 2015/0241,468 | METHOD AND APPARATUS FOR AUTOMATED SCANNING PROBE MICROSCOPY | Feb 24, 15 | Aug 27, 15 | NUOMEDIS AG |
| 2015/0241,469 | PRECISE PROBE PLACEMENT IN AUTOMATED SCANNING PROBE MICROSCOPY SYSTEMS | Feb 24, 15 | Aug 27, 15 | |
| 2015/0241,470 | METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR DUAL RESONANCE FREQUENCY ENHANCED ELECTROSTATIC FORCE MICROSCOPY | Sep 16, 13 | Aug 27, 15 | THE UNIVERSITY OF NORTH CAROLINA AT CHAPEL HILL |
| 2015/0226,766 | APPARATUS AND METHOD FOR ATOMIC FORCE MICROSCOPY | Jul 05, 13 | Aug 13, 15 | IMEC, |
Top Owners in This Class
Top Owners in This Subclass
Applications Filed in This Class - By Year
Applications Filed in This Subclass - By Year
Patents Issued To Date - By Filing Year
Average Time to Issuance
- 35 Months (last 2 years Issuances)
- 35 Months (last 5 years Issuances)
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