Class G01N : INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Subclass 1/32: Sampling; Preparing specimens for investigation (handling materials for automatic analysis G01N 35/00) Preparing specimens for investigation (mounting specimens on microscopic slides G02B 21/34; means for supporting the objects or the materials to be analysed in electron microscopes H01J 37/2) Polishing; Etching
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 12259313 | Rapid and comprehensive method for evaluating pitting resistance of stainless steel pipe welds | Sep 04, 24 | Mar 25, 25 | Tianjin University |
| 12236573 | Optical end-pointing for integrated circuit delayering; systems and methods using the same | Dec 01, 21 | Feb 25, 25 | Battelle Memorial Institute |
| 12228484 | Broad ion beam (BIB) systems for more efficient processing of multiple samples | May 19, 22 | Feb 18, 25 | FEI Company |
| 12165840 | Ion beam delayering system and method, topographically enhanced delayered sample produced thereby, and imaging methods and systems related thereto | Nov 20, 19 | Dec 10, 24 | Techinsights Inc. |
| 12106466 | Photographing condition determining method for metal structure, photographing method for metal structure, phase classification method for metal structure, photographing condition determining device for metal structure, photographing device for metal structure, phase classification device for metal structure, material property estimating method for metal material, and material property estimating device for metal material | Mar 08, 21 | Oct 01, 24 | JFE Steel Corporation |
| 12085703 | Physical calibration slide | Aug 06, 20 | Sep 10, 24 | Leica Biosystems Imaging, Inc. |
| 12038388 | Method for evaluating defect in monoclinic gallium oxide | Jul 15, 21 | Jul 16, 24 | THE INDUSTRY & ACADEMIC COOPERATION IN CHUNGNAM NATIONAL UNIVERSITY (IAC) |
| 12040196 | Perimeter trench formation and delineation etch delayering | Jan 19, 22 | Jul 16, 24 | FEI Company |
| 12031920 | Method for detecting coverage rate of intermetallic compound | Dec 06, 19 | Jul 09, 24 | Weifang Goertek Microelectronics Co., Ltd. |
| 11998956 | Method of, and an apparatus for, rinsing materialographic samples | Feb 24, 20 | Jun 04, 24 | STRUERS APS |
| 12000764 | Planar grinder | May 26, 20 | Jun 04, 24 | Illinois Tool Works Inc. |
| 11977009 | Analysis device, analysis method, and storage medium | Aug 25, 22 | May 07, 24 | Honda Motor Co. Ltd. |
| 11965734 | Method and system for quantitatively evaluating surface roughness of organic pore of kerogen in shale | Oct 01, 20 | Apr 23, 24 | NORTHEAST PETROLEUM UNIVERSITY |
| 11894216 | Method of preparing and analyzing thin films | Dec 09, 20 | Feb 06, 24 | Yangtze Memory Technologies Co., Ltd. |
| 11860082 | Method of determining an index of quality of a weld in a formed object through mechanical contact testing | Jul 18, 19 | Jan 02, 24 | Massachusetts Materials Technologies LLC |
| 11841355 | Intelligent quantitative microscopic identification system and intelligent identification method for whole rock polished sections | Nov 01, 21 | Dec 12, 23 | Yangtze University |
| 11837510 | Method for analyzing silicon substrate | Apr 08, 19 | Dec 05, 23 | Kioxia Corporation |
| 11837435 | Atom probe tomography specimen preparation | Aug 19, 20 | Dec 05, 23 | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 11815437 | Method of acquiring sample for evaluation of SiC single crystal | Dec 03, 19 | Nov 14, 23 | Resonac Corporation |
| 11798804 | Method of material deposition | Dec 09, 20 | Oct 24, 23 | FEI Company |
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2025/0093,240 | METHOD OF IDENTIFYING DEFECTS IN CRYSTALS | Jul 18, 24 | Mar 20, 25 | GLOBALWAFERS CO., LTD. |
| 2025/0003,841 | Ion Milling Device | Oct 01, 21 | Jan 02, 25 | Not available |
| 2024/0404,786 | METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INVESTIGATION DEVICE TO PERFORM SUCH METHOD | Aug 06, 24 | Dec 05, 24 | Not available |
| 2024/0255,438 | METHODS FOR DETECTING DEFECTS IN A SINGLE CRYSTAL SILICON STRUCTURE | Jan 29, 24 | Aug 01, 24 | Not available |
| 2024/0249,910 | SUPPORT STRUCTURE OF INVERTED LAMELLA FOR TALL ROI | Jan 19, 24 | Jul 25, 24 | Not available |
| 2024/0183,774 | METHOD FOR SCREENING THE OPTIMAL ZINC ION CONCENTRATION OF A PRIMARY LOOP DURING A THERMAL STATE FUNCTION TEST OF A NUCLEAR POWER PLANT | Nov 15, 23 | Jun 06, 24 | Not available |
| 2024/0183,805 | QUALITY CONTROL EVALUATION METHOD OF CYANATE ESTER MATRIX RESIN MATERIAL WITHIN CFRP COMPOSITE CONCERNING LOCALIZED HYDROLYTIC DEGRADATION | Dec 05, 22 | Jun 06, 24 | The Aerospace Corporation |
| 2024/0085,282 | APPARATUS FOR MANUFACTURING ANALYTICAL SEMICONDUCTOR SAMPLES AND METHOD FOR MANUFACTURING ANALYTICAL SEMICONDUCTOR SAMPLES BY USING THE SAME | Aug 23, 23 | Mar 14, 24 | Samsung Electronics Co., Ltd. |
| 2022/0381,761 | METHOD FOR DETERMINING TRACE METALS IN SILICON | Jul 21, 20 | Dec 01, 22 | Wacker Chemie AG |
| 2019/0204,199 | FULL-VIEW-FIELD QUANTITATIVE STATISTICAL DISTRIBUTION CHARACTERIZATION METHOD OF PRECIPITATE PARTICLES IN METAL MATERIAL | Dec 26, 18 | Jul 04, 19 | Not available |
| 2017/0276,577 | COLOURING METHOD FOR WROUGHT ALUMINIUM ALLOY WELDED JOINT COLOUR METALLOGRAPHY | Oct 12, 15 | Sep 28, 17 | CRRC QINGDAO SIFANG CO., LTD. |
| 2017/0097,290 | METHOD OF PREPARING A SAMPLE FOR MICROSTRUCTURE DIAGNOSTICS, AND SAMPLE FOR MICROSTRUCTURE DIAGNOSTICS | Oct 06, 16 | Apr 06, 17 | FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. |
| 2017/0089,813 | METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL THEREOF | Dec 14, 16 | Mar 30, 17 | TECHINSIGHTS INC. |
| 2015/0369,709 | FILM REMOVING DEVICE | Oct 23, 14 | Dec 24, 15 | BEIJING BOE DISPLAY TECHNOLOGY CO., LTD., BOE TECHNOLOGY GROUP CO., LTD., |
| 2015/0370,060 | MICROSCOPE SLIDE WITH ETCHED SHAPES | Jun 19, 15 | Dec 24, 15 | RESOLUTION BIOMEDICAL, INC. |
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