G01J

Watch

Stats

Description

MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY (light sources F21, H01J, H01K, H05B; investigating properties of materials by optical means G01N)

Subclasses

Not Available
Subclass Title
1/00 Photometry, e.g. photographic exposure meter (spectrophotometry G01J 3/00; specially adapted for radiation pyrometry G01J 5/00)
1/02 Photometry, e.g. photographic exposure meter (spectrophotometry G01J 3/00; specially adapted for radiation pyrometry G01J 5/00) Details
1/04 Photometry, e.g. photographic exposure meter (spectrophotometry G01J 3/00; specially adapted for radiation pyrometry G01J 5/00) Details Optical or mechanical part
1/06 Photometry, e.g. photographic exposure meter (spectrophotometry G01J 3/00; specially adapted for radiation pyrometry G01J 5/00) Details Optical or mechanical part Restricting the angle of incident light
1/08 Photometry, e.g. photographic exposure meter (spectrophotometry G01J 3/00; specially adapted for radiation pyrometry G01J 5/00) Details Arrangements of light sources specially adapted for photometry

more results

Recent Patents

Not Available
Patent #TitleFiling DateIssue DatePatent Owner
9,120,180 Interactive control system, methods of making the same, and devices incorporating the same Jul 09, 13 Sep 01, 15 ELECTRO SCIENTIFIC INDUSTRIES, INC., ELECTRO SCIENTIFIC INDUSTRIES INC.
9,121,623 Thermostat with wiring terminals configured for spatial compactness and ease of wire installation Sep 21, 12 Sep 01, 15 GOOGLE INC., GOOGLE INC.
9,121,695 Multi PSD-arrangement and circuitry Aug 14, 12 Sep 01, 15 LEICA GEOSYSTEMS AG, LEICA GEOSYSTEMS AG
9,121,696 Device and method for measuring via hole of silicon wafer Jun 24, 11 Sep 01, 15 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE, KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
9,121,755 Emission and transmission optical spectrometer Sep 10, 12 Sep 01, 15 THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC, THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC
9,121,756 Method and system for improving precision of element measurement based on laser-induced breakdown spectroscopy Aug 30, 11 Sep 01, 15 TSINGHUA UNIVERSITY, 501 TSINGHUA UNIVERSITY
9,121,757 Terahertz ellipsometer system, and method of use May 05, 14 Sep 01, 15 J.A. WOOLLAM CO., INC., J. A. WOOLLAM CO. INC.
9,121,758 Four-axis gimbaled airborne sensor having a second coelostat mirror to rotate about a third axis substantially perpendicular to both first and second axes Jul 26, 13 Sep 01, 15 RAYTHEON COMPANY, RAYTHEON COMPANY
9,121,759 Arrangements for detecting light of different wavelength at different angles Sep 09, 13 Sep 01, 15 HEPTAGON MICRO OPTICS PTE. LTD., HEPTAGON MICRO OPTICS PTE. LTD.
9,121,760 Room-temperature filtering for passive infrared imaging Aug 10, 10 Sep 01, 15 CI SYSTEMS LTD., CI SYSTEMS LTD.
9,121,761 Infrared detectors Nov 07, 12 Sep 01, 15 SAMSUNG ELECTRONICS CO., LTD., SAMSUNG ELECTRONICS CO., LTD.
9,121,762 Discriminating photo counts and dark counts in an avalanche photodiode output May 10, 13 Sep 01, 15 VOXTEL, INC., VOXTEL INC.
9,121,763 Spectrometer Mar 04, 14 Sep 01, 15 SEIKO EPSON CORPORATION, SEIKO EPSON CORPORATION
9,121,764 Providing image data Dec 02, 11 Sep 01, 15 PHASE FOCUS LIMITED, PHASE FOCUS LIMITED
9,121,765 Method and device for inspecting containers and preforms Jul 11, 12 Sep 01, 15 KRONES AG, KRONES AG
9,121,766 Multi pixel photo detector array of Geiger mode avalanche photodiodes Sep 15, 11 Sep 01, 15 STMICROELECTRONICS S.R.L., STMICROELECTRONICS S.R.L
9,121,774 Microwave thermometry for microwave ablation systems Jun 21, 13 Sep 01, 15 COVIDIEN LP, COVIDIEN LP
9,121,776 Welding arc apparel with UV or thermochromic activated images Oct 05, 12 Sep 01, 15 LINCOLN GLOBAL, INC., LINCOLN GLOBAL, INC.
9,121,815 Method for measuring fiber content of polyethyleneterephthalate and polytrimethyleneterephthalate fibers Apr 30, 13 Sep 01, 15 HYUNDAI MOTOR COMPANY, HYUNDAI MOTOR COMPANY
9,121,818 Movable body spectrum measuring apparatus and movable body spectrum measuring method Jul 30, 10 Sep 01, 15 TOYOTA JIDOSHA KABUSHIKI KAISHA, C/O TOYOTA JIDOSHA KABUSHIKI KAISHA

more results

Recent Publications

Not Available
Publication #TitleFiling DatePub DatePatent Owner
2015/0245,769 Optical Measurement Device And Probe System Sep 19, 13 Sep 03, 15 KONICA MINOLTA, INC.,
2015/0247,663 APPARATUS FOR DEFROSTING EVAPORATOR IN REFRIGERATION SYSTEM USING INFRARED EMITTING DIODE SENSOR Aug 01, 14 Sep 03, 15 SINJIN ENERTEC CO., LTD,
2015/0247,755 Pulse Width Modulation of Continuum Sources for Determination of Chemical Composition May 14, 15 Sep 03, 15 ,
2015/0247,756 BROADBAND OR MID-INFRARED FIBER LIGHT SOURCES May 19, 15 Sep 03, 15 ,
2015/0247,757 Chip for Plasma Generation, Plasma Generator, and Plasma Spectrometry Method Feb 26, 15 Sep 03, 15 ARKRAY, INC.,
2015/0247,758 MICROBOLOMETER CONTACT SYSTEMS AND METHODS May 11, 15 Sep 03, 15 FLIR SYSTEMS, INC.,
2015/0247,793 SPECTROPHOTOMETER Jul 22, 13 Sep 03, 15 HITACHI HIGH-TECHNOLOGIES CORPORATION,
2015/0249,104 IMAGE SENSOR DEVICE Oct 17, 13 Sep 03, 15 MITSUBISHI ELECTRIC CORPORATION,
2015/0246,148 COMPACT SYSTEM WITH HIGH HOMOGENEITY OF THE RADIATION FIELD May 15, 15 Sep 03, 15 SCHOTT AG,
2015/0246,413 WELDED PORTION INSPECTION METHOD Feb 09, 15 Sep 03, 15 TOYOTA JIDOSHA KABUSHIKI KAISHA,
2015/0246,410 Chip for Plasma Generation, Plasma Generator, and Plasma Spectrometry Method Feb 26, 15 Sep 03, 15 ARKRAY, INC.,
2015/0239,255 Liquid Consuming Apparatus and Method for Controlling Liquid Consuming Apparatus Feb 12, 15 Aug 27, 15 SEIKO EPSON CORPORATION,
2015/0241,268 MEASURING MODULE FOR REMISSION PHOTOMETRIC ANALYSIS AND METHOD FOR THE PRODUCTION THEREOF Sep 05, 13 Aug 27, 15 JENOPTIK POLYMER SYSTEMS GMBH,
2015/0241,269 OPTICAL COMMUNICATION MODULE AND METHOD FOR ASSEMBLING SAME Jan 30, 15 Aug 27, 15 HON HAI PRECISION INDUSTRY CO., LTD.,
2015/0241,270 OPTICAL MODULE AND ELECTRONIC APPARATUS Feb 23, 15 Aug 27, 15 SEIKO EPSON CORPORATION,
2015/0241,271 OPTICAL FREQUENCY TRACKING AND STABILIZATION BASED ON EXTRA-CAVITY FREQUENCY Mar 02, 15 Aug 27, 15 RAM PHOTONICS, LLC,
2015/0241,272 Pulsed Plasma Monitoring Using Optical Sensor Feb 25, 14 Aug 27, 15 APPLIED MATERIALS, INC.,
2015/0241,273 WEARABLE RADIATION DETECTOR Mar 04, 15 Aug 27, 15 ,
2015/0241,274 Method and Apparatus for Luminaire Characterization Feb 26, 14 Aug 27, 15 SENSITY SYSTEMS, INC.,
2015/0241,275 SPECTROMETER Jul 29, 13 Aug 27, 15 HAMAMATSU PHOTONICS K.K.,

more results

Patents Issued To Date - By Filing Year

Average Time to Issuance

We are sorry but your current selection exceeds the maximum number of watches () for this membership level. Upgrade to our Level for up to watches!

UPGRADE MEMBERSHIP CANCEL
We are sorry but Dashboard Viewer is not able to watch the Technologies/Sub-Technologies.