Class G01D : MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
Subclass 3/00: Measuring arrangements with provision for the special purposes referred to in the subgroups of this group
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 12085418 | Abnormality detection apparatus for resolver | Feb 26, 20 | Sep 10, 24 | Mitsubishi Electric Corporation |
| 11632118 | Closed-loop oscillator based sensor interface circuit | May 25, 21 | Apr 18, 23 | MELEXIS TECHNOLOGIES NV |
| 11422074 | Lossless cryo-grid preparation stage for high-resolution electron microscopy | Jul 06, 15 | Aug 23, 22 | Universitat Basel |
| 11085801 | Physical quantity measuring apparatus | Mar 14, 19 | Aug 10, 21 | Alps Alpine Co., Ltd. |
| 10630399 | Testing distributed applications that have an established exchange in an advanced message queuing protocol (AMQP) message broker | May 05, 17 | Apr 21, 20 | Dell Products, L.P. |
| 10552993 | Detecting method and system for touch apparatus | Apr 24, 17 | Feb 04, 20 | Acer Incorporated |
| 10523199 | Housings for inductive proximity sensors | Dec 20, 11 | Dec 31, 19 | Not available |
| 10444744 | Decoupled load generation architecture | Jan 28, 11 | Oct 15, 19 | Amazon Technologies, Inc. |
| 10295373 | Magnetic absolute position sensor having a wiegand module | May 31, 17 | May 21, 19 | Avago Technologies International Sales Pte. Limited |
| 10006782 | Characterization of sensor data for vehicle telematics | Nov 12, 14 | Jun 26, 18 | Moj.io Inc. |
| 9897463 | Method for operating a sensor system, sensor system and measurement signal | Aug 19, 15 | Feb 20, 18 | BALLUFF GMBH |
| 9835470 | MEMS sensor filtering with error feedback | Mar 27, 14 | Dec 05, 17 | HONEYWELL INTERNATIONAL INC. |
| 9784765 | Graphic actuation of test and measurement triggers | Nov 03, 09 | Oct 10, 17 | TEKTRONIX, INC. |
| 9709624 | Automatic test system and method | Apr 07, 14 | Jul 18, 17 | INVENTEC CORPORATION, INVENTEC (PUDONG) TECHNOLOGY CORPORATION, |
| 9664492 | Methods and apparatus for defining a probe configuration using a probe configuration tool | Dec 27, 12 | May 30, 17 | GENERAL ELECTRIC COMPANY |
| 9664529 | Determining installation locations for meters | Jul 31, 12 | May 30, 17 | HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP |
| 9618363 | Specimen analysis system, specimen analyzer, and specimen analysis method | Aug 02, 13 | Apr 11, 17 | SYSMEX CORPORATION |
| 9614648 | Method and apparatus for controlling energy expanding of sensor network nodes | Apr 19, 07 | Apr 04, 17 | KONINKLIJKE PHILIPS ELECTRONICS N V, PHILIPS LIGHTING HOLDING B.V., |
| 9605710 | Method and device for the early detection of the development of damage in a bearing | Mar 01, 10 | Mar 28, 17 | SIEMENS AKTIENGESELLSCHAFT |
| 9602299 | Detection of device compliance with an operational policy | Sep 06, 11 | Mar 21, 17 | AMAZON TECHNOLOGIES, INC. |
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2024/0118,117 | DATA PROCESSING DEVICE, MEASUREMENT SYSTEM, AND DATA PROCESSING METHOD | Mar 26, 21 | Apr 11, 24 | NEC CORPORATION |
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