G01D 1/16

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Class  G01D : MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR


Subclass 1/16: Measuring arrangements giving results other than momentary value of variable, of general application ( G01D 3/00 takes precedence; in tariff metering apparatus G01D 4/00 ; transducers not specially adapted for a specific variable G01D 5/00 ) giving a value which is a function of two or more values, e.g. product, ratio

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
12182828 Estimating footfall for a locationSep 09, 21Dec 31, 24Placense LTD.
12163975 Signal processing method, signal processing device, physical quantity measurement device, and sensor moduleDec 27, 21Dec 10, 24Seiko Epson Corporation
12146894 Lid angle detectionMay 27, 22Nov 19, 24SMI STMicroelectronics S.r.l
12123742 Walk discrimination device, walk discrimination method, and program recording mediumMar 27, 19Oct 22, 24NEC Corporation
12123745 Device for measuring various properties of coatings and materials and methods of using the sameFeb 24, 22Oct 22, 24Wood Coatings Research Group, Inc.
12111159 Azimuth estimation deviceDec 02, 21Oct 08, 24Honda Motor Co. Ltd.
12025633 Two-wire interface reference accelerometer with integrated mechanical transducing and self-calibration capabilityFeb 25, 22Jul 02, 24Vibration Measurement Solutions, Inc.
12013413 Microelectromechanical acceleration sensor systemJan 10, 22Jun 18, 24502 Robert Bosch GmbH
12000858 Vibration rectification error correction device, sensor module, and vibration rectification error correction methodDec 27, 21Jun 04, 24Seiko Epson Corporation
11920931 Gyroscope with self-testMay 04, 21Mar 05, 24Murata Manufacturing Co Ltd.
11402403 Vehicle detection methodDec 11, 19Aug 02, 22SEIKO EPSON CORPORATION
11333678 Method for offset calibration of a yaw rate sensor signal of a yaw rate sensor, system and computer programSep 26, 19May 17, 22Robert Bosch GmbH
11274939 Sensor data segmentation and virtualizationSep 10, 18Mar 15, 22IBM Corporation
11204258 Apparatus for sensing rotating deviceMay 22, 19Dec 21, 21SAMSUNG-ELECTRO-MECHANICS CO. LTD.
11193816 Health monitor method for an equipment and system thereofDec 27, 18Dec 07, 21(6) INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
11156476 Abnormality determination device, abnormality determination method, and non-transitory recording mediumFeb 05, 18Oct 26, 21NEC Corporation
10845210 Sensor with interface for functional safetyDec 22, 17Nov 24, 20Infineon Technologies AG
10754922 Method and apparatus for sensor fusionApr 25, 16Aug 25, 20Lockheed Martin Corporation
10753745 Gyroscope loop filterJan 26, 16Aug 25, 20Atlantic Inertial Systems Limited
10627265 Sensor assignment apparatus and sensor diagnostic apparatusMar 17, 15Apr 21, 20KABUSHIKI KAISHA TOSHIBA

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2025/0035,669 LID ANGLE DETECTIONOct 10, 24Jan 30, 25SMI STMicroelectronics S.r.l
2023/0341,242 Calculation Method for thickness of inner oxide layer of martensitic heat-resistant steel in steam environmentJun 15, 23Oct 26, 23Not available
2020/0300,661 INFORMATION PROCESSING APPARATUS AND NON-TRANSITORY COMPUTER READABLE MEDIUMAug 22, 19Sep 24, 20FUJI XEROX CO., LTD.
2018/0188,071 SENSOR WITH INTERFACE FOR FUNCTIONAL SAFETYDec 22, 17Jul 05, 18Not available

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Patents Issued To Date - By Filing Year

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