G01B 3/18

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Description

Class  G01B : MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS


Subclass 3/18: Instruments as specified in the subgroups and characterised by the use of mechanical measuring means (arrangements for measuring particular parameters G01B 5/00; devices of general interest specially adapted or mounted for storing and repeatedly paying-out and re-storing lengths of material B65H 75/34) Micrometers

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
12159981 Apparatus and method for detection of deformation in battery cellsDec 02, 22Dec 03, 24Tesla, Inc.
12055925 Measuring instrument and method of remote quantity value transfer/traceability thereofNov 11, 21Aug 06, 24Not available
11821724 Digital micrometerJun 07, 19Nov 21, 23Mitutoyo Corporation
11713983 Sensing winding configuration for inductive position encoderJun 30, 21Aug 01, 23MITUTOYO CORPORATION
11543225 Caliper measurement force detecting deviceMay 19, 21Jan 03, 23Mitutoyo Corporation
11539112 Measuring instrument with coupled antennaJan 07, 21Dec 27, 222J ANTENNAS USA, CORPORATION
11522232 Apparatus and method for detection of deformation in battery cellsFeb 26, 19Dec 06, 22Tesla, Inc.
11493116 Micro head and stage mechanism using the sameOct 01, 19Nov 08, 22BIBLIOS Co., LTD.
11466971 Automatic measuring deviceApr 12, 21Oct 11, 22Mitutoyo Corporation
11280602 Micrometer for measuring dimension of a conductive objectSep 11, 20Mar 22, 22SEWON ELECTRONICS CO., LTD.
11280389 Spindle driveMay 02, 18Mar 22, 22Eppendorf AG
11041707 Roundness measuring deviceNov 02, 18Jun 22, 21Mitutoyo Corporation
10996043 Method for controlling small-sized measurement deviceMar 14, 19May 04, 21Mitutoyo Corporation
10825216 Apparatus for reading value measured with analog measuring toolDec 05, 18Nov 03, 20Mitutoyo Corporation
10673174 Digital measurement instrumentApr 30, 18Jun 02, 20Mitutoyo Corporation
10598524 Measuring instrument that detects displacement of a contact pointJun 29, 17Mar 24, 20Mitutoyo Corporation
10451450 External device for measuring instrumentJul 05, 17Oct 22, 19Mitutoyo Corporation
10317202 Parameter setting method of measuring instrument and computer readable mediumAug 27, 15Jun 11, 19Mitutoyo Corporation
10295324 Measuring instrumentJun 01, 17May 21, 19Mitutoyo Corporation
10283922 Connection unit for connecting external device to measurement device and measurement device optional system using the connection unitOct 04, 17May 07, 19Mitutoyo Corporation

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2025/0085,095 Micrometer With Pressure SensorSep 12, 23Mar 13, 25Not available
2025/0076,021 AUTOMATIC MEASURING APPARATUSAug 30, 24Mar 06, 25Mitutoyo Corporation
2024/0421,661 MICROMETER DRIVER SYSTEM AND METHODJun 16, 23Dec 19, 24Not available
2024/0102,784 MICROMETER HEAD DISPLACEMENT SYSTEM UTILIZING IMAGINGSep 28, 22Mar 28, 24Not available
2024/0035,816 AUTOMATIC MEASURING DEVICE AND CONTROL METHOD OF THE SAMEJul 27, 23Feb 01, 24Mitutoyo Corporation
2023/0408,237 SYSTEM FOR MEASURING A CHANGING CRACK IN A WALL OR THE LIKESep 28, 21Dec 21, 23Not available
2019/0063,894 Bar Length Detection Tool and Method for Detecting Bar LengthAug 23, 18Feb 28, 19Not available

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Patents Issued To Date - By Filing Year

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