Fine particle measuring apparatus

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United States of America Patent

PATENT NO RE49543
SERIAL NO

16008766

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Abstract

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A fine particle measuring apparatus is provided. The fine particle measuring apparatus includes a detection unit configured to detect light emitted from a fine particle and a processing unit having a memory device storing instructions which when executed by the processing unit, cause the processing unit to calculate a corrected intensity value of the detected light and generate spectrum data based on the corrected intensity value.

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Patent Owner(s)

Patent OwnerAddress
SONY CORPORATIONTOKYO 108-0075

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nitta, Nao Tokyo, JP 22 96

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