Lithography system, sensor, converter element and method of manufacture

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United States of America Patent

PATENT NO RE47287
SERIAL NO

14602294

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Charged particle beamlet lithography system for transferring a pattern to a surface of a target comprising a sensor for determining one or more characteristics of one or more charged particle beamlets. The sensor comprises a converter element for receiving charged particles and generating photons in response. The converter element comprises a surface for receiving one or more charged particle beamlets, the surface being provided with one or more cells for evaluating one or more individual beamlets. Each cell comprises a predetermined blocking pattern of one or more charged particle blocking structures forming multiple knife edges at transitions between blocking and non-blocking regions along a predetermined beamlet scan trajectory over the converter element surface. The converter element surface is covered with a coating layer substantially permeable for said charged particles and substantially impermeable for ambient light. An electrically conductive layer is located between the coating layer and the blocking structures.

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Patent Owner(s)

Patent OwnerAddress
ASML NETHERLANDS B VP O BOX 324 VELDHOVEN 5500 AH

International Classification(s)

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  • 2015 Application Filing Year
  • H01J Class
  • 2290 Applications Filed
  • 1843 Patents Issued To-Date
  • 80.49 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances20152016201720182019202020212022202320240255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hanfoug, Rabah Gouda, NL 2 8

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges1224171267333112101 - 1011 - 2021 - 3031 - 4041 - 5051 - 6081 - 90100 +0100200300400500600700800900100011001200130014001500160017001800

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