Semiconductor integrated circuit with voltage limiter having different output ranges from normal operation and performing of aging tests
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United States of America
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Aug 13, 1996
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Apr 28, 1992
filing date -
Apr 17, 1981
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Abstract
In a voltage converter which is disposed in a semiconductor integrated circuit so as to lower an external supply voltage and to feed the lowered voltage to a partial circuit of the integrated circuit, the voltage converter is constructed so as to produce an output voltage suited to an ordinary operation in the ordinary operation state of the semiconductor integrated circuit and an aging voltage in the aging test of the circuit.
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