Computer controlled high-speed circuit for testing electronic devices
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United States of America
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Oct 12, 1982
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N/A
app pub date -
May 28, 1980
filing date -
Mar 23, 1977
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Abstract
High-speed testing circuitry which, when coupled to one terminal of a multi-terminal electronic device, such as an integrated circuit, can either supply test stimuli signals up to a frequency of 30 MHz, receive output signals produced by the device under test in response to test stimuli signals applied by associated test circuits and compare these signals against computer predicted signals, or provide for parametric testing of the device. .Iadd.
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