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Country	kind	publication No.	Filing Date	Type	Sub-Type
AT	B	AT403962	Oct 30, 1996	Patent	Grant
Type : Patent Sub-Type : Grant
PATENT SPECIFICATION		VORRICHTUNG ZUR DURCHFÜHRUNG VON ELEKTROCHEMISCHEN UND/ODER OPTISCHEN MESSVORGÄNGEN IN FLÜSSIGKEITEN		Jul 27, 1998
US	A	US6001228	Sep 23, 1997	Patent	Grant
Type : Patent Sub-Type : Grant
PATENT		Device for performing measurements in fluids		Dec 14, 1999
EP	B1	EP0846947	Oct 09, 1997	Patent	Grant
Type : Patent Sub-Type : Grant
Patent		Vorrichtung zur Durchführung von elektrochemischen und/oder optischen Messvorgängen in Flüssigkeiten		Dec 19, 2001
JP	B2	JP2955705	Oct 27, 1997	Patent	Grant
Type : Patent Sub-Type : Grant
PUBLISHED GRANTED PATENT (SECOND LEVEL)		FLUID-MEASURING APPARATUS		Oct 04, 1999

• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
AVL MEDICAL INSTRUMENTS AG	STETTEMERSTRASSE 28 CH-8207 SCHAFFHAUSEN

International Classification(s)

• 2404:MATERIALS FOR DRESSING WOUNDS, NURSING AND MEDICAL....

• 1997 Application Filing Year
• 2404 Class
• 0 Applications Filed
• 0 Patents Issued To-Date
• 0 % Issued To-Date

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Dolezal, Andreas	Graz, AT	3	486
# of filed Patents : 3 Total Citations : 486
Huber, Wolfgang	Lieboch, AT	59	409
# of filed Patents : 59 Total Citations : 409
Ritter, Christoph	Graz, AT	15	714
# of filed Patents : 15 Total Citations : 714
Schaffar, Bernhard	Graz, AT	13	599
# of filed Patents : 13 Total Citations : 599

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Patent Citation Ranking

• 2 Citation Count
• 2404 Class

• 0 % this patent is cited more than
• 26 Age

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

Full Text

US Patent No: 9606212

Systems and methods for time/frequency indexed pulse calibrations for vector network analyzers

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Abstract

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A method for measuring scattering parameters in a device under test (DUT) using a vector network analyzer (VNA), includes calibrating the VNA to generate corrections for deterministic setup defects and mapping a plurality of error terms based on a plurality of time indices, wherein each time indicia is associated with an error term. A test signal is transmitted to the DUT to obtain a measurement signal from the DUT in response to the test signal. The generated corrections to obtained measurements are time aligned based on the mapped error terms.

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Description

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Claims

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• AS2014
• AS2014
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Mar 28, 2017	I	Issuance
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Dec 22, 2014	AS	ASSIGNMENT	free format text: CORRECTIVE ASSIGNMENT TO CORRECT THE RECEIVING PARTY NAME PREVIOUSLY RECORDED ON REEL 034571 FRAME 0523. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT;ASSIGNOR:MARTENS, JON S.;REEL/FRAME:042386/0766 Owner name: ANRITSU COMPANY, CALIFORNIA Effective Date: Dec 22, 2014
Dec 22, 2014	AS	ASSIGNMENT	free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:MARTENS, JON S.;REEL/FRAME:034571/0523 Owner name: ANRITSU CORPORATION, CALIFORNIA Effective Date: Dec 22, 2014
Mar 14, 2014	F	Filing