Impedance calibration device for semiconductor device
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United States of America Patent
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Jun 12, 2018
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app pub date -
May 31, 2016
filing date -
May 31, 2016
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Abstract
An impedance calibration device for a semiconductor device includes a process sensor that detects a process condition for the semiconductor device and outputs a process signal, a temperature monitoring sensor that detects a temperature of the semiconductor device and outputs a temperature signal, a converter that converts the process signal and the temperature signal into a digital signal, and a code generation circuit that generates and outputs a driving code for controlling a level of a voltage at an output node according to the digital signal of the converter and a data signal. The impedance calibration device further includes an output driver that pulls up or pulls down the voltage at the output node according to the driving code.
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