Thin film transistor, manufacturing method and testing method thereof, array substrate and display device
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United States of America Patent
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Jun 12, 2018
Issued Date -
Mar 1, 2018
app pub date -
Nov 8, 2016
filing date -
Jan 8, 2016
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Abstract
A thin film transistor and manufacturing and testing methods thereof, an array substrate and a display device, and the thin film transistor includes a semiconductor layer, at least three source/drain electrodes and a gate electrode. The semiconductor layer includes a non-doped part which is continuously formed and at least three doped parts which are connected with the non-doped part; the doped parts are spaced from each other and distributed at a periphery of the non-doped part; the source/drain electrodes are spaced from each other and respectively electrically connected with the doped parts; and the gate electrode overlaps the non-doped part in a direction perpendicular to the semiconductor layer and at least extends to a junction of the non-doped part and each doped part. The thin film transistor can improve the accuracy of comparison results of the characteristics of sub-thin film transistors included by the thin film transistor.
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