Methods and apparatus for outlier detection and correction of structured light depth maps
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United States of America Patent
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Jun 12, 2018
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Mar 14, 2016
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Dec 22, 2015
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Abstract
Systems and methods for correcting errors in a depth map generated by a structured light system are disclosed. In one aspect, a method includes dividing a depth map into segments and calculating a density distribution of the depth values for each segment. The method includes detecting error (or “outlier”) values by determining the depth values that fall outside of a range of depth values, the range of depth values representative of the highest density depth values for a given segment. The method includes detecting error values in the depth map as a whole based on the density distribution values for each segment.
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