Methods and apparatuses for etch profile optimization by reflectance spectra matching and surface kinetic model optimization
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United States of America Patent
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Jun 12, 2018
Issued Date -
N/A
app pub date -
Sep 7, 2017
filing date -
Feb 8, 2016
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Disclosed are methods of optimizing a computer model which relates the etch profile of a feature on a semiconductor substrate to a set of independent input parameters (A), via the use of a plurality of model parameters (B). In some embodiments, the methods may include modifying one or more values of B so as to reduce a metric indicative of the differences between computed reflectance spectra generated from the model and corresponding experimental reflectance spectra with respect to one or more sets of values of A. In some embodiments, calculating the metric may include an operation of projecting the computed and corresponding experimental reflectance spectra onto a reduced-dimensional subspace and calculating the difference between the reflectance spectra as projected onto the subspace. Also disclosed are etch systems implementing such optimized computer models.
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Patent Citation Ranking
- 12 Citation Count
- G01N Class
- 91.88 % this patent is cited more than
- 7 Age
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