In-line inspection of ophthalmic device with auto-alignment system and interferometer
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jun 12, 2018
Issued Date -
N/A
app pub date -
Aug 25, 2015
filing date -
Aug 28, 2014
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Disclosed are in-line apparatuses, systems and methods for measuring a physical characteristic of a constant supply of an ophthalmic device, the apparatuses including: an interferometer; an automatic alignment system that positions the interferometer or ophthalmic device; and a central processing unit in communication with the automatic alignment system and receiving measurements from the interferometer. The in-line apparatus measures the desired physical dimensions of the ophthalmic device in real time. In-line systems, apparatuses and methods for measuring a physical characteristic of an ophthalmic device can include: a camera imaging an actual position of a feature of the ophthalmic device; a vibration resistant interferometer projecting a surface measurement beam having a wavelength that transmits through a beam splitter onto the ophthalmic device; and an automatic alignment system positioning the interferometer and the camera.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully