X-ray anti-scatter grid with varying grid ratio

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United States of America Patent

PATENT NO 9993219
SERIAL NO

15073909

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Abstract

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A device for estimating scatter in X-ray imaging is described. An anti-scatter grid with varying grid ratio is used in conjunction with an X-ray detector. The anti-scatter grid comprises attenuating lamellae that block scattered radiation. The anti-scatter grid contains regions of lesser or greater scatter rejection efficiency, which can be achieved by variations in the grid ratio. Contrast between these regions can be used to estimate residual scatter content. A method for estimating scatter from this device is further described.

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Patent Owner(s)

Patent OwnerAddress
THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITYCALIFORNIA USA CALIFORNIA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hsieh, Scott Anaheim, US 12 274

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