Systems and methods for measuring and tracking radio-frequency identification tags
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United States of America Patent
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Jun 5, 2018
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N/A
app pub date -
May 15, 2017
filing date -
Jul 10, 2013
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Abstract
Systems and methods are provided for measuring and tracking radio-frequency (RFID) tags. Inlay data, converting data, and tag scan data can be received from entities in the supply chain and stored in a database. The tag scan data, including measurement and performance data, can be stored and used for applications such as determining whether RFID tags are defective. The tag scan data, inlay data, and converting data can be analyzed to produce analytic data for reporting and failure prediction purposes. Inlay-SKU combinations of RFID tags can be validated to ensure that the correct inlays are being utilized for RFID tags intended for particular products. More accurate inventory data may be obtained and costs for re-tagging products that have defective RFID tags may be reduced. Entities in the supply chain can also be assisted to comply with various quality control, licensing, and tracking requirements related to the RFID tags.
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