Method of generating test patterns using random function

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United States of America Patent

PATENT NO 9989842
APP PUB NO 20170017748A1
SERIAL NO

15058300

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Abstract

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Provided is a method of generating test patterns. The method includes generating a first polygon, disposing the first polygon in a pattern region, selecting one region from peripheral regions of the first polygon, generating a second polygon, disposing the second polygon in the selected region, and repeating the above processes.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG ELECTRONICS CO LTDGYEONGGI DO SOUTH KOREA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jung, Jeeeun Yongin-si, KR 6 0
Lee, Jeonghoon Suwon-si, KR 78 333

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