Systems and methods for evaluating errors and impairments in a digital-to-analog converter
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United States of America Patent
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May 29, 2018
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May 26, 2017
filing date -
May 26, 2017
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Abstract
Exemplary embodiments of the present invention pertain to circuitry provided in a digital-to-analog converter (DAC) for carrying out measurements indicative of various performance characteristics of the DAC. In one exemplary implementation, a control circuit containing one or more switches is used to controllably route into a measurement system, a portion of a signal that straddles a boundary between a first digital data bit and a second digital data bit in a sequence of digital data bits that are received in a DAC cell of the DAC. The control circuit, which can be included in one or more DAC cells of the DAC, is connected to a branch of a differential circuit that is provided in each of the DAC cells of the DAC, in a manner that does not affect digital-to-analog conversion in the DAC cells.
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