Measuring apparatus and measuring method

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United States of America Patent

PATENT NO 9983069
SERIAL NO

14996197

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Abstract

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A measuring apparatus includes a light source unit configured to generate probe light, a bifurcating unit configured to cause Brillouin backscattered light occurring from the probe light to bifurcate into first light, which propagates through a first optical path, and second light, which propagates through a second optical path, a delay unit configured to delay one of the first light and the second light, an optical multiplexer configured to multiplex the first light and the second light to generate multiplexed light, and a coherent detector configured to perform homodyne detection of the multiplexed light and to output a difference frequency obtained as a result of the detection as a phase-difference signal.

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Patent Owner(s)

Patent OwnerAddress
OKI ELECTRIC INDUSTTY CO LTD1-7-12 TORANOMON MINATO-KU TOKYO 105-8460

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Koizumi, Kengo Tokyo, JP 7 29

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