Overheat detection circuit and semiconductor device
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United States of America Patent
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May 29, 2018
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N/A
app pub date -
Dec 15, 2015
filing date -
Dec 24, 2014
priority date (Note) -
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Abstract
Provided is an overheat detection circuit that is capable of quickly outputting an overheated state detection signal in an overheated state without outputting an unintended erroneous output caused by disturbance noise, such as momentary voltage fluctuations in the power supply. The overheat detection circuit includes: a temperature sensor; a comparison section; and a disturbance noise removal section configured to output an overheated state detection signal to an output section after a predetermined delay time has elapsed. The delay time is reduced in proportion to temperature.
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