Optimal data eye for improved Vref margin
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United States of America Patent
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May 15, 2018
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Mar 23, 2017
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May 9, 2016
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Abstract
An optimized method, system, and apparatus for determining optimal DQS delay for DDR memory interfaces are disclosed. The method performs data eye training in a two dimensional space with time delay value as x-axis and reference voltage (Vref) as y-axis to determine a rectangular data eye within an overall data eye with Vref margin.
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