Method for improving measurement accuracy and devices and systems related thereto
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United States of America Patent
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May 15, 2018
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N/A
app pub date -
Feb 17, 2016
filing date -
Dec 21, 2012
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Abstract
The present disclosure relates to methods and devices for providing accurate measurement of a property of a sample. The method comprises obtaining a plurality of independent measurements of the property. The plurality of values of the property of the sample obtained by the plurality of independent measurements is compared to determine whether one or more of the values is an outlier.
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