Semiconductor device and battery voltage measuring method that prevents measurement error caused by parametric capacitance
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United States of America Patent
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May 8, 2018
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app pub date -
Dec 18, 2015
filing date -
Dec 25, 2014
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Abstract
The present disclosure provides a semiconductor device including: a first buffer amplifier into which a voltage of a high potential side of one battery cell selected from plural battery cells that are connected in series is input; a second buffer amplifier into which a voltage of a low potential side of the one battery cell other than a lowermost stage battery cell is input; an analog level shifter into which a voltage output from the first buffer amplifier and a voltage output from, the buffer amplifier are input; a first switch that switches a voltage input to the analog level shifter from the voltage output from the second buffer amplifier to a reference voltage; and a second switch that switches a voltage input to the first buffer amplifier from the voltage of the high potential side of the one battery cell to the reference voltage.
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