Image inspection device, image inspection method and image inspection program
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
May 1, 2018
Issued Date -
N/A
app pub date -
Jul 13, 2016
filing date -
Jul 30, 2015
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Provided is an image inspection device, an image inspection method and an image inspection program which are capable of easily and accurately inspecting a shape of an inspection target. In a setting mode, positioning image data of a setting target placed on a stage is registered. In an inspection mode, a positioning image is displayed on a display part based on the positioning image data. An image for positioning of the inspection target placed on the stage is displayed in the display part. Thereafter, image data for alignment of the inspection target is acquired, and then aligned to image data for alignment of the setting target. A size in a height direction of a measurement target place of the inspection target is measured based on the aligned height image data, to determine Pass/Fail of the inspection target. The determined determination result is displayed on the display unit.
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully