Testing machine and operation method thereof
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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May 1, 2018
Issued Date -
N/A
app pub date -
Mar 9, 2016
filing date -
Mar 11, 2015
priority date (Note) -
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Abstract
A test machine includes a base, a testing platform, a probe platform, a control lever, a temporary positioning mechanism and a damper. The testing platform connects with the base and carries a device under test. The probe platform connects with the base and moves along a longitudinal direction. The probe platform connects with a probe. The control lever connects with the base and the probe platform which is driven by the control lever to move along the longitudinal direction. The temporary positioning mechanism connects with the control lever and temporarily holds the probe platform and the control lever at a specific position. The damper connects with the base. When a distance between the probe and the DUT is shorter than a buffering distance, the damper abuts against the control lever or the probe platform to reduce a velocity of the probe moving towards the DUT.
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