Test system and test method
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United States of America Patent
Stats
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Apr 24, 2018
Issued Date -
N/A
app pub date -
Jun 14, 2017
filing date -
Jun 14, 2017
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A test system for testing a device under test comprising an antenna array with multiple antennas and capable of controlling a radiation pattern of the antenna array, may comprise a test antenna system for emitting outgoing test signals to the device under test and receiving incoming test signals from the device under test, a control unit for controlling the device under test to set a first radiation pattern with a theoretical main lobe pointing to the test antenna system or to set a second radiation pattern with a main lobe comprising an angle larger than 0° with the main lobe of the first radiation pattern, and a test processing unit for evaluating the device under test based on signal levels of incoming test signals received by the test antenna system from the device under test and/or based on signal levels of outgoing test signals as received by the device under test.
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Cited Art Landscape
Patent Citation Ranking
- 3 Citation Count
- H04B Class
- 20.43 % this patent is cited more than
- 7 Age
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