Semiconductor memory devices and methods of operating the same
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United States of America Patent
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Apr 24, 2018
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Dec 30, 2016
filing date -
Feb 29, 2012
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Abstract
A method of operating a semiconductor memory device is provided. In a method of operating a semiconductor memory device including a memory cell array which includes a plurality of bank arrays, memory cells in a first region of the memory cell array are tested to detect one or more failed cells in the first region, a fail address corresponding to the detected one or more failed cells is determined and the determined fail address is stored in a second region different from the first region, in the memory cell array.
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