Separated parallel beam generation for atom interferometry
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United States of America Patent
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Apr 24, 2018
Issued Date -
N/A
app pub date -
Jan 10, 2017
filing date -
Jun 22, 2016
priority date (Note) -
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status (Latency Note)
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Abstract
An atomic interferometer and methods for measuring phase shifts in interference fringes using the same. The atomic interferometer has a laser beam traversing an ensemble of atoms along a first path and an optical components train with at least one alignment-insensitive beam routing element configured to reflect the laser beam along a second path that is anti-parallel with respect to the first laser beam path. Any excursion from parallelism of the second beam path with respect to the first is rigorously independent of variation of the first laser beam path in yaw parallel to an underlying plane.
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International Classification(s)
- 2017 Application Filing Year
- G21K Class
- 261 Applications Filed
- 176 Patents Issued To-Date
- 67.44 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 2 Citation Count
- G21K Class
- 19.18 % this patent is cited more than
- 7 Age
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