Methods and systems for detector gap corrections
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United States of America Patent
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Apr 17, 2018
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Mar 13, 2015
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Mar 13, 2015
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Abstract
Methods and systems are provided for correcting positional errors in an image arising from gaps in a detector assembly. In one embodiment, a method comprises generating a sinogram based on a plurality of photon coincidence events, selectively inserting one or more pseudo-slices into the sinogram, and generating an image based on the sinogram including the one or more pseudo-slices. In this way, positional errors may be reduced without modifying an image reconstruction algorithm to include a full detector geometry or modifying the detector geometry itself.
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