MEASURING AND CORRECTING NON-IDEALITIES OF A SYSTEM
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
N/A
app pub date -
Oct 18, 2016
filing date -
Oct 18, 2016
priority date (Note) -
Granted
status (Latency Note)
Importance
Abstract
Many systems implement calibration schemes to measure and correct for the non-idealities. Such systems can be complex, which makes them impractical to implement since the cost can potentially outweigh the benefits of the calibration scheme. To implement efficient and effective calibration, non-idealities or errors of a system are detected, in foreground or in background, in a piecewise fashion based on, e.g., correlations of an output signal with an uncorrelated random signal, where the correlation results are processed separately for different open intervals of an error signal. Second order and third order correction terms can be easily determined based on three open intervals. In various embodiments, the calibration scheme can detect and correct for linear errors, (linear and non-linear) memory/frequency dependent errors, static nonlinearity errors, Hammerstein-style non-linearity errors, and Wiener-style non-linearity errors (cross-terms).
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully