Capacitance measurement
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United States of America Patent
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Apr 10, 2018
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app pub date -
Sep 25, 2015
filing date -
Sep 25, 2015
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Abstract
Embodiments of the present invention may provide a method of measuring an unknown capacitance of a device. The method may comprise the steps of driving a test signal to a circuit system that includes a current divider formed by the device with unknown capacitance and a reference capacitor; mirroring a current developed in the reference capacitor to a second circuit system that includes a measurement impedance; measuring a voltage within the second circuit system; and deriving a capacitance of the unknown capacitance based on the measured voltage with reference to a capacitance of the reference capacitor and the measurement impedance.
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