Test circuit for testing a device-under-test by using a voltage-setting unit to pull an end of the device-under-test to a predetermined voltage
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United States of America Patent
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Apr 10, 2018
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N/A
app pub date -
Apr 6, 2016
filing date -
Apr 6, 2016
priority date (Note) -
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Abstract
A test circuit includes a pull-up device, a pull-down device, a switch circuit and a voltage-setting unit. The pull-up device is used to receive a first control signal and coupled to a first end of the device-under-test. The pull-down device is used to receive a second control signal and coupled to the first end of the device-under-test. The switch unit is controlled by a switch signal, used to receive a testing signal and coupled to a second end of the device-under-test. The voltage-setting unit is controlled by a third control signal, used to pull the second end of the device-under-test to a predetermined voltage.
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