Testing integrated circuit designs containing multiple phase rotators
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United States of America Patent
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Mar 27, 2018
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Jan 15, 2014
filing date -
Jan 15, 2014
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Abstract
Approaches for testing phase rotators are provided. A circuit for testing phase rotators includes a compare element including a first input and a second input, wherein the compare element is configured to compare a first phase of a first signal provided at the first input to a second phase of a second signal provided at the second input. The circuit also includes a first test bus connected to the first input and a second test bus connected to the second input.
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