Sample chamber
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United States of America Patent
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Mar 27, 2018
Issued Date -
N/A
app pub date -
Sep 23, 2009
filing date -
Sep 30, 2008
priority date (Note) -
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Abstract
The invention relates to a sample chamber for testing samples, comprising a bottom plate and a cover plate connected thereto, a sample reservoir for receiving a liquid and/or a sample to be tested, and a contact electrode which is arranged entirely in the bottom plate, in the cover plate or between the bottom plate and the cover plate and which is electrically conductively connected to a conductor element or semiconductor element disposed in and/or on the sample chamber, wherein the bottom plate and/or the cover plate are designed in such a way that an electrical contact with the contact electrode can be established from the outside in such a way that an electrically conductive connection to the conductor element or to the semiconductor element can be established from the outside through the bottom plate or through the cover plate via the contact electrode.
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