IMAGING DEVICE WITH ALIGNMENT ANALYSIS
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United States of America Patent
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Sep 22, 2016
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Sep 22, 2016
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Abstract
Disclosed is an imaging device employing a measurement zone directed at a target, where the imaging device can be used in conjunction with a misalignment analysis feature. The imaging device can capture first and second images at different times. The first and second images may be compared, such as by comparing a location of the measurement zone of the imaging device in the first image with a location of the measurement zone of the imaging device in the second image. Based on the comparison, a misalignment indication of the imaging device relative to the target can be provided.
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