Booster circuit including a booster section configured to operate intermittently
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United States of America Patent
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Mar 20, 2018
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N/A
app pub date -
Jun 20, 2017
filing date -
Jun 28, 2016
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Abstract
Provided is a booster circuit enabling improvement of efficiency of a stress test for a circuit to which a boosted voltage is applied. A voltage divider circuit is configured to have a voltage-dividing ratio that is variable depending on a test signal, and a limiter circuit is configured to clamp a voltage to a voltage higher than a boosted voltage in normal operation. In a test mode, the voltage divider circuit is controlled so that the boosted voltage becomes higher than that in the normal operation, and the limiter circuit clamps the boosted voltage, with the result that a booster section continuously operates.
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