Gallium nitride apparatus with a trap rich region

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United States of America Patent

PATENT NO 9923060
SERIAL NO

15165122

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A method cold-melts a high conductivity region between a high-resistivity silicon substrate and a gallium-nitride layer to form a trap rich region that substantially immobilizes charge carriers in that region. Such a process should substantially mitigate the parasitic impact of that region on circuits formed at least in part by the gallium-nitride layer.

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ANALOG DEVICES INCONE ANALOG WAY WILMINGTON MA 01887

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Inventor Name Address # of filed Patents Total Citations
Deliwala, Shrenik Andover, US 120 1428
Fiorenza, James Carlisle, US 32 1944
Jin, Donghyun Medford, US 34 57

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