Field strength monitoring for optimal performance

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United States of America Patent

PATENT NO 9921256
SERIAL NO

14847599

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Abstract

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Disclosed are various embodiments for field strength monitoring of electromagnetic fields generated by a guided surface waveguide probe. A field meter measures the field strength of the electromagnetic field. The field meter communicates the measured field strength to a probe control system coupled to the guided surface waveguide probe. Adjustments can be made to one or more operational parameters of the guided surface waveguide probe according to the measured field strength.

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Patent Owner(s)

Patent OwnerAddress
CPG TECHNOLOGIES LLC1130 DALE ACRES ROAD ITALY TX 76651-1034

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Corum, James F Morgantown, US 142 1712
Corum, Kenneth L Plymouth, US 125 1428
Lilly, James D Silver Spring, US 58 1479
Pinzone, Joseph F Cornelius, US 45 641

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