Surface property measuring apparatus and method for controlling the same

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United States of America Patent

PATENT NO 9921044
SERIAL NO

14264416

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Abstract

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A surface property measuring apparatus includes a control unit, configured to control operations of a roughness measuring instrument and a relative moving mechanism, including: a measuring force command module configured to output a measuring command; and a measuring force control module configured to control the direction and magnitude of the measuring force, wherein the measuring force control module instructs a measuring force application unit of the roughness measuring instrument to generate therein the measuring force whose magnitude and direction are designated by the measuring force command when a displacement speed of a measuring arm is equal to or slower than a predetermined threshold, and the measuring force control module instructs the measuring force application unit to generate therein a force in a direction in which the distal end of the measuring arm is raised upwards when the displacement speed of the measuring arm exceeds the predetermined threshold.

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Patent Owner(s)

Patent OwnerAddress
MITUTOYO CORPORATIONKAWASAKI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nakayama, Tatsuki Kure, JP 14 125

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  • 1 Citation Count
  • G01B Class
  • 21.98 % this patent is cited more than
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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges2979287828733321101 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 1000501001502002503003504004505005506006507007508008509009501000

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