Wafer-level bonding packaging method and wafer structure

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United States of America Patent

PATENT NO 9919918
SERIAL NO

15214108

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Abstract

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The present disclosure provides a wafer-level bonding packaging method, including: providing a plurality of first wafers and a plurality of second wafers, a to-be-bonded surface of a first wafer being a first to-be-bonded surface, a to-be-bonded surface of a second wafer being a second to-be-bonded surface, and the first to-be-bonded surface including a first region and a second region; forming at least one first bonding structure on the second region; forming at least one second bonding structure on a second to-be-bonded surface, the at least one second bonding structure corresponding to the at least one first bonding structure; and forming a supporting layer on the first region, a height of supporting layer being greater than a height of the first bonding structure and less than a sum of the height of the first bonding structure and a height of the second bonding structure.

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Patent Owner(s)

Patent OwnerAddress
SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION201203 18 ZHANGJIANG ROAD SHANGHAI PUDONG NEW AREA MUNICIPAL DISTRICT SHANGHAI CITY 201203
SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION100176 BEIJING BEIJING DAXING DISTRICT ECONOMIC AND TECHNOLOGICAL DEVELOPMENT ZONE (YIZHUANG) 18 WENCHANG AVENUE MUNICIPAL DISTRICT BEIJING CITY 100176

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Xu, Wei Shanghai, CN 934 8439

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