Testing device and testing method with noise level adjustment
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United States of America Patent
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Mar 13, 2018
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app pub date -
Jun 13, 2016
filing date -
Jun 13, 2016
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Abstract
A testing device is provided. The testing device comprises a signal generating unit configured to generate a first number of signals based on a number of receiving components of a device under test, and at least one noise generating unit, each configured to generate noise and to apply the noise to the first number of signals, such that one of a preset total noise power and a preset signal-to-noise ratio is achieved at a reference point associated with the device under test. The testing device is configured to output a second number of signals to the device under test, wherein the second number of signals corresponds to one of the first number of signals and the first number of signals with the applied noise.
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