Semiconductor device drive method

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United States of America Patent

PATENT NO 9915961
SERIAL NO

14845885

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A semiconductor device drive method achieves a balance between a lifetime and a detection sensitivity which are required for a temperature detection diode formed via an insulating film on a substrate on which an active element is formed. The semiconductor device drive method includes energizing the temperature detection diode with a constant current, the constant current having a current density value between an upper limit defined based on the lifetime of the temperature detection diode, and a lower defined based on a variation allowable voltage of an output voltage of the temperature detection diode with respect to a standard deviation.

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Patent Owner(s)

Patent OwnerAddress
FUJI ELECTRIC CO LTDJAPAN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Abe, Hitoshi Matsumoto, JP 109 1794
Matsui, Toshiyuki Matsumoto, JP 45 238
Yao, Noriaki Matsumoto, JP 9 27

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