Bi-directional association and graphical acquisition of time-based equipment sensor data and material-based metrology statistical process control data

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United States of America Patent

PATENT NO 9915940
SERIAL NO

13664347

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Abstract

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A method and system for linking sensor data to metrology data and metrology data to sensor data is described herein. In one embodiment, a user selection of metrology data for a product is received, related process tool fault detection summary for the selected metrology data for the product is presented, a user selection of a process tool from the process tool fault detection summary is received, and related fault detection details for the selected process tool are presented.

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Patent Owner(s)

Patent OwnerAddress
APPLIED MATERIALS INC3050 BOWERS AVENUE SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dox, Joseph Bosford, US 1 7
Schulze, Brad Phoenix, US 1 7

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