System and method for automated test-pattern-free projection calibration
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United States of America Patent
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Mar 13, 2018
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Dec 9, 2013
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Dec 9, 2013
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Abstract
Systems and methods for calibrating an image projection system, using image capture devices are disclosed. In particular, Wide-Angle (WA) and Ultra Wide-Angle (UWA) lenses can be utilized to eliminate need for traditional test patterns and tedious alignment settings. That is particularly useful for automatic calibration of projection sources that may require frequent adjustments on the field. Geometric mapping techniques combined with image analytics allow identifying parallel lines in an image captured from a scene. Coordinates of vanishing points corresponding to pairs of parallel lines provide sufficient information to determine orientation of the image projection system in space.
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